EPSC Microanalysis Facility
Research Capabilities
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Electron-probe Microanalysis
- JEOL JXA-8200 electron microprobe 5 WDS and SDD EDS
- Wavelength-dispersive spectrometry including H-type spectrometer
- Energy-dispersive spectrometry E2V Gresham silicon-drift EDS
- Secondary and backscattered-electron SEM imaging
- Quantitative and Intensity-based X-ray mapping
- Cathodoluminescence imaging
- Probe for EPMA, Probe Image, Jeol microprobe software
X-ray Powder Diffraction
Bruker d8 Advance
- Position-sensitive detector LynxEyeXE
- Search-match using ICDD PDF-4+ and COD databases
- Topas Rietveld refinement, quantitative analysis, other capabilities
Contact and Mailing address |
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Contact:
Paul Carpenter (email preferred): Paul Carpenter
Electron Microprobe and X-ray Diffraction Specialist
Mailing address (need room no. for Fedex):
Paul Carpenter
Earth and Planetary Sciences, CB 1169, Room 110
Washington University
1 Brookings Drive
St. Louis, MO, 63130
Paul Carpenter, Phone (314) 935-2585
Dr. Brad Jolliff
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Analytical Techniques and
Instrument Information |
Electron-probe Microanalysis
Powder X-ray Diffraction
Micro X-ray Fluorescence
Instrument Scheduling
We use the LabArchives Scheduler.
Please request an invitation from Paul Carpenter
then use this link to log in.
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